BCHETNIA, O.; AL HARBI, F.; ALMUTAIRI, A.; ESAAHLI, F. X-ray diffraction study of the strain-stress thickness profiling in GaN⁄(〖Al〗_2 O_3 ) heterostructure. Journal of Qassim University for Science, [S. l.], v. 1, n. 1, p. 27–41, 2022. Disponível em: https://jnsm.qu.edu.sa/index.php/jnm/article/view/2298. Acesso em: 21 nov. 2024.