Gassoumi , M. . (2016) “Electrically Active Defects in 4H-SiC Schottky Barrier Diodes Characterization by DLTS System”, Journal of Qassim University for Science, 9(1), pp. 95–106. Available at: https://jnsm.qu.edu.sa/index.php/jnm/article/view/1786 (Accessed: 20 September 2024).