Bchetnia, O., F. al harbi, A. Almutairi, and F. Esaahli. “X-Ray Diffraction Study of the Strain-Stress Thickness Profiling in GaN⁄(〖Al〗_2 O_3 ) Heterostructure”. Journal of Qassim University for Science, vol. 1, no. 1, Jan. 2022, pp. 27-41, https://jnsm.qu.edu.sa/index.php/jnm/article/view/2298.