Published: 2023-01-07


80-89


90-128


164-185


129-153



X-ray diffraction study of the strain-stress thickness profiling in GaN⁄(〖Al〗_2 O_3 ) heterostructure

O. Bchetnia, Fedia Ghaleb al harbi, Asma Aedh S Almutairi, , Fatma Hfaiedh Esaahli

27-41


14-26


42-51


64-79